Global Sources
EE Times-Asia
Stay in touch with EE Times Asia
?
EE Times-Asia > T&M
?
?
T&M??

Teradyne supplies RFID test systems to J750 systems

Posted: 17 Mar 2005 ?? ?Print Version ?Bookmark and Share

Keywords:beijing huada? j750? test system? rfid? smart card?

Teradyne Inc. disclosed that Beijing Huada, a VLSI testing service and solution provider for Beijing and Northern China, has purchased multiple J750 test systems to meet production capacity for RFID smart card testing.

That history with Teradyne goes back to 1999, when Beijing Huada's parent company, CIDC, ordered its first two J750 systems, and then, five years later, opted for another J750 that they used primarily for RFID smart card projects.

"The J750 provides a productive test platform with highly parallel, low cost test for their demanding market," said SI Wei, Manager, Teradyne semiconductor test field operations.





Article Comments - Teradyne supplies RFID test systems ...
Comments:??
*? You can enter [0] more charecters.
*Verify code:
?
?
Webinars

Seminars

Visit Asia Webinars to learn about the latest in technology and get practical design tips.

?
?
Back to Top