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Tool cuts test time for automotive devices

Posted: 26 May 2008 ?? ?Print Version ?Bookmark and Share

Keywords:mixed-signal test system? DC test?

Advantest Corp. has introduced the T7723 mixed-signal test system with high-throughput and highly-parallel test capabilities for testing high-density automotive devices. This production test solution is aimed at high-power, high-density mixed-signal devices for automotive as well as consumer applications.

The T7723's scalable architecture and all-in-one test head capable of high-speed, high-accuracy and parallel testing of up to 32 devices, contribute to an improvement in throughput for mass production, Advantest said. In addition, the T7723 offers double the test resources of its predecessor, thanks to the incorporation of the company's newly-developed floating high-power DC in the system's DC test unit. (The DC test unit measures the properties of direct currents from devices including I/O currents, I/O voltages and power supply.)

The T7723 also delivers a 30A high-voltage test capability, which is 1.5x greater than that of the company's earlier model. In addition, up to 64 relay circuits can be integrated within the test unit, enabling the system to measure electrical current more efficiently, further enhancing its capabilities for multi-pin device test. With these new functions, the T7723 can perform simultaneous test of high-density, high-voltage devices that incorporate BCD process technology used in power management in vehicles, resulting in a reduction in test time of up to 30 percent.

In comparison with the previous model, the T7723 offers 1.8x more space for loading the peripheral circuits. In addition, the relays that were formerly attached to the performance board are now housed within the tester itself, in the floating high-power DC unit. These features ensure that the area of the test head devoted to device test is maximized, enabling enhanced levels of parallelism and a significant reduction in the cost of test, Advantest said.

Other key specifications include parallel test capacity of up to 32 devices, digital test fixture: No. of channels up to 256ch and test speed of 20/62.5/125MHz. For analog test fixture, PHDC: up to 256ch, 64V/24mA, 24V/64mA; HDC: up to 8ch, 150V/80mA, 32V/2A and FHPDC: up to 8ch, 60V/10A, 30V/30A (pulse), up to 64 ports. The device also features a digitizer/optional signal generator: 4ch differential and a sampling rate of 51.2MSps.

The T7723 mixed-signal test system will be on display at the Advantest Tour de Force 2008 exhibition, Tokyo International Forum, June 3-5.

Pricing starts at $419K. Devices will be available in June.

- Gina Roos
eeProductCenter





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