Global Sources
EE Times-Asia
Stay in touch with EE Times Asia
?
EE Times-Asia > Embedded
?
?
Embedded??

Tool cuts testing time of device development code

Posted: 21 Jul 2008 ?? ?Print Version ?Bookmark and Share

Keywords:development code testing? device software development? test automation tools?

Wind River Systems has added a scalable, distributed testing framework that connects device software development with quality assurance teams in a collaborative workflow.

Wind River Test Management is designed to help device manufacturers significantly shorten the testing process. It results in driving down product development costs and bringing devices to market more quickly, said Wind River.

Specifically, Wind River Test Management will automate the software quality assurance process and improve overall code quality. It is expected to be available in the third quarter of 2008.

Market research firm Venture Development Corp's 2008 survey of embedded developers shows that developers using test automation tools report a greater percentage of their projects completed on time or ahead of schedule than those who are not using a formal test automation tool.

According to VDC, the worldwide test automation market is projected to grow annually at more than 12 percent from 2006 through 2009. VDC said the acceleration is driven by the adoption of new technologies, primarily multicore processors, increasingly complex design requirements and evolving consumer expectations amid increasing time-to-market pressures.

"Quality is a corner office issue and is directly related to brand and revenue impact," said Amit Ronen, vice president and general manager of device management at Wind River.

The software tool will enable teams to efficiently plan tests, execute tests, perform fact-based analysis, and rapidly resolve issues encountered throughout the testing phase. For instance, when the quality assurance team finds a defect, developers can immediately access detailed logs and fault data collected in the test lab to quickly isolate and resolve the defect on their cross-development environment.

- Nicolas Mokhoff
EE Times





Article Comments - Tool cuts testing time of device dev...
Comments:??
*? You can enter [0] more charecters.
*Verify code:
?
?
Webinars

Seminars

Visit Asia Webinars to learn about the latest in technology and get practical design tips.

?
?
Back to Top