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JTAG beefs up lineup with new tools, updates

Posted: 05 Sep 2008 ?? ?Print Version ?Bookmark and Share

Keywords:tool update ProVision? 2008 electronica? software?

JTAG Technologies will be showcasing several new tools and updates at electronica 2008, which will take place Nov.10-11 at New Munich Trade Fair Center, Munich, Germany. One of the updated solutions is the JTAG Technologies Application Executor (AEX), a full-functioned test sequencer and manager, which is now integrated into ProVision. Test engineers develop and validate complete sequences for their test and ISP applications utilizing the conditional branching and command and control capabilities of AEX, all within the JTAG ProVision development environment. The sequences developed with JTAG ProVision are easily exported to run on stand-alone or integrated test systems stations using JTAG production software.

Other notable enhancements in the latest ProVision release include: automated support of complex buffering and MUX configurations for flash programming and test; simplified generation of infrastructure tests requiring only the models of the boundary-scan devices, not the entire board; and the addition of numerous new device models to the JTAG ProVision library. As with previous releases, JTAG ProVision remains fully compatible with the prior "Classic" development tools as well as with all of JTAG Technologies production systems.

Meanwhile, a new hardware that will be on display at electronica is the RMI, a fully-featured DataBlaster

controller together with a front-end QuadPOD, packaged into a convenient form factor that's for mounting in a standard 19-inch equipment rack. The four TAPs are easily accessed on the front panel of the RMI. In addition to the TAPs, the front panel contains connectors for 256 programmable I/Os that can be used enhancing boundary-scan access on target board or system. Clients can use the RMI with their existing test sequencer, including our AEX or National Instruments TestStand.

USB flavor
JTAG also presents the new USB version of its low-cost 3705 Explorer, one of the first commercially available boundary-scan controllers.

The new USB version of the 3705 Explorer, JT 3705/USB, still offers a fully functional boundary-scan controller featuring two test access ports and more voltage options than before in a highly compact form-factor. The JT 3705/USB is powered from the USB interface making it portable and compatible with laptop use. It can be fully synchronised for test purposes and is compatible with all JTAG 's development tools such as JTAG ProVision and production packages such as the Stand-alone package (PSA) and the Production Integration Packages for LabVIEW, LabWindows, TestStand as well as C/C++ and Visual Basic. The JT 3705/USB can be used for structural board testing, in-system device programming (ISP) of CPLDs, and in-system programming of small blocks of flash memory data etc. Programmable output levels per TAP (1.5V to 3.6 volts) make the JT3705/USB compatible with all current and future logic families. Test clock frequency may also be programmed from 100Hz to a brisk 6MHz allowing test applications to be executed in a 'snap'.





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