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Memory test system handles 1,280 devices in parallel

Posted: 04 Dec 2009 ?? ?Print Version ?Bookmark and Share

Keywords:memory test solution? probe? chassis?

Teradyne has unveiled the Magnum 2x, the latest member of its Magnum family of memory test solutions, capable of testing over 1,280 devices in parallel, delivering high level of efficiency for probe and package testing. Designed for massive parallel test applications, the Magnum 2x achieves speeds up to 800Mbit/s for full performance testing of memory and logic devices.

"The memory market continues to progress with greater densities and higher volumesand cost is always a top priority for our customers," said Tim Moriarty, VP and general manager of memory products, Teradyne. "We are very confident that the Magnum 2x, with its extended test capacity, will reinforce Teradyne's leadership position in low-cost, volume testing."

Magnum 2x delivers the required flexibility allowing customers to choose the configuration that best fits their needs today, and in the future. System configurations start with one chassis offering up to 1,280 pins; two chassis with up to 2,560 pins; four chassis with up to 5,120; and eight chassis with up to 10,240 pinseach with the same small footprint as Magnum 2. Additionally, test engineers can run their existing Magnum 2 test programs on the 2x; resulting in significant savings of time, resources and test costs.

The Magnum 2x provides 400MHz clocks and data rates up to 800Mbit/s in SuperMux mode, without any loss of resources. In support of these high data rates, Magnum 2x delivers 175ps edge accuracy and the waveform fidelity needed to support both engineering and production solutions. The Magnum 2x also promotes its extended logic capability that supports up to 256MV per-pin and independent data per-pin for flexible testing of high-speed devices.

The Magnum 2x�s Algorithmic Pattern Generator has high efficiency throughput and supports the testing of terabyte scale memories. The error capture and redundancy analysis circuits are optimized to capture up to 5,760Gbit of error information per system, at-speed, with redundancy and fail processing in the background.

Teradyne has shipped the low-cost Magnum 2x test systems to major customers in the Pacific Rim.

The Magnum 2x test products are currently available and pricing is based on configuration.





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