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Agilent and Innofidei develop RF Tests for TD-LTE chipset

Posted: 20 Sep 2010 ?? ?Print Version ?Bookmark and Share

Keywords:test development? 3GPP LTE? RF test? signal generator? signal analyzer?

Agilent Technologies Inc. and Innofidei, a wireless chipset provider based in Beijing, collaborated on a TD-LTE data dongle RF test. The test development is based on the 3GPP LTE specifications, Innofidei's TD-LTE test requirements, and included Agilent's N5182A signal generator combined with the N9020A signal analyzer. The TD-LTE RF test was preformed successfully by following the 3GPP LTE standard chapter 6 and 7 Transmitter / Receiver characteristics.

President of Agilent (China), Lan Tao emphasizes Agilent's committed to providing TD-SCDMA and TD-LTE test solutions saying, "Agilent desires to work with leading chipset vendors such as Innofidei to build up the TD-LTE ecosystem and plans to be one of the key test contributors when China deploys its next-generation wireless applications."

Meanwhile, Innofidei's CEO Tom Zhang cites, "This is a milestone for both companies. We appreciate this close collaboration with Agilent, which allowed us to meet our test requirements."





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