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Integrate flexible R&D testbed for LTE

Posted: 14 Jan 2011 ?? ?Print Version ?Bookmark and Share

Keywords:SystemVue? test waveforms? 3GPP?

This application note describes an integrated solution for testing wireless communication systems based on the quickly evolving LTE standard. Agilent SystemVue is recommended as the core software in this test solution to integrate all test instruments, create new test waveforms, enable measurements, and provide a software reference receiver. An integrated test system configured for LTE base station receiver measurements is used as an example. It is well known that receiver sensitivity is an important measurement for describing LTE receiver performance. To test receiver sensitivity according to the latest 3GPP LTE specifications, Agilent proposes a test system using SystemVue with a built-in reference receiver and certain auto-configuration capabilities. In this configuration, this system can be used to test both frequency division duplex (FDD) and time division duplex (TDD) uplink receivers that are specified in LTE. Receiver performance curves for throughput vs signal-to-noise ratio and for block-error-rate vs. signal-to-noise ratio are generated quickly, with reasonable test accuracy.

View the PDF document for more information.





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