Global Sources
EE Times-Asia
Stay in touch with EE Times Asia
?
EE Times-Asia > T&M
?
?
T&M??

InPA Systems reveals Active Debug and Full Visibility prototyping tech

Posted: 27 Jan 2011 ?? ?Print Version ?Bookmark and Share

Keywords:FPGA? rapid prototypes? SoC designs?

InPA Systems has announced that it will participate in its first conference and tradeshow at DesignCon. It's the company's first public foray since its launch in August 2010. At DesignCon, InPA shall demonstrate its Active Debug and Full Visibility technology with FPGA-based rapid prototypes. Executive Joe Gianelli shall participate in a conference panel, and semiconductor/EDA icon and key InPA advisor Bernie Aronson shall be on hand at the InPA booth to discuss chip design trends and business issues as well as how InPA fits into those directions.

InPA will exhibit its Active Debug and Full Visibility technology, which enables users unprecedented visibility and control of the verification and validation process when integrating software and hardware onto SoC designs. The primary benefit to users of such technology would be a drastic reduction in the current prototyping debug methodology's iterative process of "blind" or passive probing and multiple FPGA implementation iterations. Customers and interested parties will also be able to talk with company executives and Bernie Aronson, former CEO of Kilopass and Synplicity, who has recently joined the InPA Advisory Board, on both exhibit days.

InPA will also participate in the conference program at DesignCon, while the white paper that discusses the company's technology shall also be on hand at the InPA exhibit booth.





Article Comments - InPA Systems reveals Active Debug an...
Comments:??
*? You can enter [0] more charecters.
*Verify code:
?
?
Webinars

Seminars

Visit Asia Webinars to learn about the latest in technology and get practical design tips.

?
?
Back to Top