Global Sources
EE Times-Asia
Stay in touch with EE Times Asia
?
EE Times-Asia > T&M
?
?
T&M??

Hot TDR measurements of active devices with ENA Option TDR

Posted: 20 Jun 2012 ?? ?Print Version ?Bookmark and Share

Keywords:Impedance matching? signal integrity? return loss?

Impedance matching is crucial to the design of high speed applications because signal reflections due to impedance mismatches may have a significant impact on signal integrity. Since transmitters and receivers may cause significant reflections, they should be evaluated with great care. In fact, many modern high speed digital standards specify limits for impedance and return loss. Most of the standards require that the devices be operating during measurements, because the device characteristics are different between the power-on state and the power-off state. The purpose of this application note is to describe an effective evaluation method for the impedance measurement of active devices under actual operating conditions.

View the PDF document for more information.

Originally published by Agilent Technologies Inc. at www.agilent.com as "Effective Hot TDR Measurements of Active Devices Using ENA Option TDR".





Article Comments - Hot TDR measurements of active devic...
Comments:??
*? You can enter [0] more charecters.
*Verify code:
?
?
Webinars

Seminars

Visit Asia Webinars to learn about the latest in technology and get practical design tips.

?
?
Back to Top