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How to validate high- and full-speed USB on DSP

Posted: 16 Sep 2014 ?? ?Print Version ?Bookmark and Share

Keywords:electrical test? USB? C5517? test instruments? TMS320C5517?

The device high-speed electrical test procedure was developed by the USB 2.0 compliance committee to verify electrical requirements of high-speed USB operations designed to meet USB 2.0 specification. This document outlines the test setup and captures the results of the series tests performed on the C5517 device. It also lists the test instruments to perform the series of tests.

View the PDF document for more information.

Originally published by Texas Instruments Inc. at www.ti.com as "Validating High- and Full-Speed USB on TMS320C5517".





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