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Marvin offers compact, cost-effective test platform

Posted: 22 Dec 2014 ?? ?Print Version ?Bookmark and Share

Keywords:Marvin Test Solutions? test platform? PXI? module?

Marvin Test Solutions has announced the latest version of its TS-900 PXI semiconductor test platform. According to the company, the TS-960 brings the performance and features of high-end systems to customers at smaller footprint and with outstanding value compared to traditional ATE.

The TS-960 platform features a 20-slot, 3U PXI chassis accommodating up to 512 125MHz digital I/O channels with PMUs per pin, yet has a small footprint and modular structure, allowing users to address a range of test applications. Available as a bench top, with an integrated cart, or with an integrated manipulator, the TS-960 platform takes full advantage of the PXI architecture to achieve a full-featured test solution for device, SoC and SiP test applications.

The GX5296 delivers high-performance digital test capabilities and is geared for addressing verification, focused production, and failure analysis test needs, or for replacing legacy test systems. The GX5296 builds on the GX5295 digital subsystem with enhanced timing performance and features.

The GX5296 occupies only a single PXI 3U slot, yet features flexible timing and high-resolution edge placement, providing no-compromise digital test capabilities as well as the flexibility to test and characterize a device's DC and AC performance, stated the company.

The GX5296 boasts 32, 125MHz digital channels, PMU per pin, and timing per pin with 1ns edge placement. It also supports 64 timing set groups, 64Mb/pin and data formatting (six formats). The module delivers -2V to 7V drive/sense range, and provides a full-featured sequencer with 16 loop counters. It is also compatible with standard digital test file formats: VCD, eVCD, STIL and WGL.





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