Global Sources
EE Times AsiaWebsite
Stay in touch with EE Times Asia
Article Comments Home?/?eeForums?/?Talk Shop?/?Article Comments
Discuss news, features and technical papers published on EE Times-Asia.
Hot Post Recommend
Understand 3G LTE testing challenges
Posted:?Apr 24, 2008 4:42 PM

With over 2.5 billion users and growing, the GSM/3GSM radio access technology dominates today’s glo...[ View complete article ]


Print ?thread
Message:?

Understand 3G LTE testing challenges

Posted:? Apr 24, 2008 4:42 PM
?

Author:Kumar_mobile

Level:? Interns

Points:? 227

Send Message

With over 2.5 billion users and growing, the GSM/3GSM radio access technology dominates today’s global cellular landscape. To keep pace with this growth and the demand for faster, more bandwidth-intensive services, it is essential that the technological infrastructure continue to evolve while remaining efficient, competitive and successful.
Reply with quote? Reply? Watch? Comment?
EETimes Asia : Display market finds strong growth trajectory in AMOLEDs
(1) Reply:Understand 3G LTE testing challenges Posted:? Apr 24, 2008 4:42 PM
?

Author:Kumar_mobile

Level:? Interns

Points:? 227

Send Message

LTE is today at the stage where Mobile WiMAX ( IEEE 802.16e-2005) was 3 years ago. Despite great industry support it will be only in 2008 i.e. three years later that the actual commecial networks are rolling out. We expect LTE to face a similar situation as not only the standards but also the spectrum and the hardware/ devices ecosystem has to fall in place. On this recokening it will be only by 2011 that we should see any networks implemented with LTE. The challange is also the evolotion from current 3G to LTE as the present network architectures have been built on the TDM and packet cores and not really a seamless IP architecture. http://www.wimax-home.com
Reply with quote? Reply? Comment?
Previous thread????Alcatel-Lucent sets up...
Color-space converter:...????Next thread??
Quick Reply
*??Nickname: Visitor (To avoid code verification, simply login or register with us. It is fast and free!)
*??Message title:
*??Comment:
*??Enter verification code::
The engineering community needs are best served with a professional environment at eeForums. And we need your help in ensuring eeForums best serves your needs. Please report offensive or irrelevant messages/replies by clicking here. Thank you for your help and participation!
Return to Article Comments | Talk Shop
The views and opinions shared on eeForums and eeBlogs are those held by users of the web site and do not represent those of EE Times Asia. EE Times Asia is not liable or responsible for any defects, deficiencies, errors, omissions or inaccuracies in any information, data or other content (whether provided or offered therein or in or through eeForums and eeBlogs).
How to earn points
The moderator marks your post as one of the following.
  • Good: +5 points
  • Very good: +10 points
  • Excellent: +20 points
  • Bad: -5 points
  • Very bad: -10 points
  • Exceptionally bad: -20 points

We also count your replies to questions posted by others.
  • You have posted 10 or more replies: +10 points
  • You have posted 20 or more replies: +50 points
  • You have posted 50 or more replies: +100 points
  • You have posted 100 or more replies: +200 points
Have Your Say!

Bloggers Say

Got something to say? Why not share it with other engineers?

Just introduce yourself to us, we'll contact you and set you up. Yes, it's that simple!

See what engineers like you are posting on our pages.

Interviews & Viewpoints

Talk

Learn how senior executives are seeing the industry from interviews and contributed opinions.

Back
?
Back to Top