Structural system test via IEEE std. 1149.1 with hierarchical and multi-drop addressable JTAG port, SCANPSC11OF

This paper shows the function of the SCANPSC110 addressable test access controller in implementing system level boundary scan nets. This paper also describes how the SCANPSC110 eliminates the shortcomings of traditional multi-channel testers while providing the capability to partition a single board level scan chain into smaller chains.

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