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Design for Testability guidelines in a combined x-ray, in-circuit environment

Posted: 01 May 2000 ?? ?Print Version ?Bookmark and Share

Keywords:agilent technologies? agilent? board test? dft? design for test?

The technique allows engineers to build assurances in testing complex PCBs during the design phase. By enabling shorter development cycles, DFT offers optimum production speeds resulting in faster time-to-market.

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