Global Sources
EE Times-Asia
Stay in touch with EE Times Asia
?
EE Times-Asia > Embedded
?
?
Embedded??

Testing designs containing embedded blocks

Posted: 01 May 2000 ?? ?Print Version ?Bookmark and Share

Keywords:mentor graphics? dft? test? embedded? stannard?

Deep-submicron processes enable increased complexity, which means that many of the embedded blocks cannot be tested using traditional methods. You must find new solutions to avoid risking product quality.

View the PDF document for more information.



Article Comments - Testing designs containing embedded ...
Comments:??
*? You can enter [0] more charecters.
*Verify code:
?
?
Webinars

Seminars

Visit Asia Webinars to learn about the latest in technology and get practical design tips.

?
?
Back to Top