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Scan insertion and ATPG development via Synopsys test compiler

Posted: 29 Aug 2000 ?? ?Print Version ?Bookmark and Share

Keywords:atmel? scan insertion? atpg development? synopsys test compiler? synopsys?

This application note presents Atmel's design guidelines, and then gives specific recommendations for scan insertion and ATPG vector generation using the Synopsys Test Compiler, version 3.2a.

View the PDF document for more information.

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