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Use of the AFM to study spin-polarized photo-emission sources

Posted: 12 Sep 2001 ?? ?Print Version ?Bookmark and Share

Keywords:burleigh? aris 3500? afm? microscope? photoemission?

This application note describes the use of the Burleigh ARIS-3500 AFM (Atomic Force Microscope) to examine photoemission sources.

View the PDF document for more information.

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