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Nanomechanical measurements on polymers using contact mode AFM

Posted: 12 Sep 2001 ?? ?Print Version ?Bookmark and Share

Keywords:burleigh? polymer? afm? microscope? surface imaging?

This application note describes the use of AFM (Atomic Force Microscopy) coupled with force curve analysis in helping to characterize the nanomechanical properties of polymer surface.

View the PDF document for more information.

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