Global Sources
EE Times-Asia
Stay in touch with EE Times Asia
?
EE Times-Asia > T&M
?
?
T&M??

Nanomechanical measurements on polymers using contact mode AFM

Posted: 12 Sep 2001 ?? ?Print Version ?Bookmark and Share

Keywords:burleigh? polymer? afm? microscope? surface imaging?

This application note describes the use of AFM (Atomic Force Microscopy) coupled with force curve analysis in helping to characterize the nanomechanical properties of polymer surface.

View the PDF document for more information.



Article Comments - Nanomechanical measurements on polym...
Comments:??
*? You can enter [0] more charecters.
*Verify code:
?
?
Webinars

Seminars

Visit Asia Webinars to learn about the latest in technology and get practical design tips.

?
?
Back to Top