T&M??
AFM: A complimentary technique for SEM investigation
Keywords:burleigh? microscope? afm? sem? surface imaging?
This application note explains the advantages of using AFM (Atomic Force Microscopy) over SEM (Scanning Electron Microscopy) in preventing surface contamination during routine imaging.
View the PDF document for more information.
View the PDF document for more information.
| Related Articles | Editor's Choice |
Article Comments - AFM: A complimentary technique for S...
Visitor(To avoid code verification, simply login or register with us. It is fast and free!)
?
Top Ranked Articles
?
Webinars
Visit Asia Webinars to learn about the latest in technology and get practical design tips.
All rights reserved.