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AFM: A complimentary technique for SEM investigation

Posted: 12 Sep 2001 ?? ?Print Version ?Bookmark and Share

Keywords:burleigh? microscope? afm? sem? surface imaging?

This application note explains the advantages of using AFM (Atomic Force Microscopy) over SEM (Scanning Electron Microscopy) in preventing surface contamination during routine imaging.

View the PDF document for more information.

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