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DC mode magnetic force microscopy using a Burleigh AFM

Posted: 12 Sep 2001 ?? ?Print Version ?Bookmark and Share

Keywords:burleigh? microscope? metris 2000? magnetic imaging?

This application note describes the modification of the Burleigh METRIS-2000 AFM (Atomic Force Microscope) so that magnetic materials could be examined for magnetization using a magnetically active tip.

View the PDF document for more information.



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