Global Sources
EE Times-Asia
Stay in touch with EE Times Asia
EE Times-Asia > T&M

Aluminum channel profile analysis and conducting polymer surface characterization

Posted: 12 Sep 2001 ?? ?Print Version ?Bookmark and Share

Keywords:burleigh? afm? microscope? aluminum? polymer?

This application note discusses AFM (Atomic Force Microscopy) as a powerful high-resolution imaging technique for examining microstructures on aluminum substrate and conductive gratings in conducting polymer films.

View the PDF document for more information.

Article Comments - Aluminum channel profile analysis an...
*? You can enter [0] more charecters.
*Verify code:


Visit Asia Webinars to learn about the latest in technology and get practical design tips.

Back to Top