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Aluminum channel profile analysis and conducting polymer surface characterization

Posted: 12 Sep 2001 ?? ?Print Version ?Bookmark and Share

Keywords:burleigh? afm? microscope? aluminum? polymer?

This application note discusses AFM (Atomic Force Microscopy) as a powerful high-resolution imaging technique for examining microstructures on aluminum substrate and conductive gratings in conducting polymer films.

View the PDF document for more information.



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