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Advantest adopts Synopsys TetraMAX ATPG technology

Posted: 24 May 2002 ?? ?Print Version ?Bookmark and Share

Keywords:Synopsys? TetraMAX ATPG? semiconductor test systems? T6000 series ATE system? IC test?

Advantest Corp., a provider of semiconductor test systems, plans to develop a diagnostics solution for deep-submicron SoC designs by leveraging Synopsys Inc.'s TetraMAX ATPG technology.

Advantest's SoC failure diagnostics tool will transfer data on the location of the failure from the T6000 series ATE system to Synopsys' TetraMAX ATPG tool to streamline the process of detecting failures in complex chips. The tool is slated for formal introduction in September 2002.

"SoC development is focused on reducing time to market, improving production margins, reducing design and manufacturing costs and implementing a DFT methodology that reduces the overall cost of test," said Nick Konidaris, president and CEO of Advantest.

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