Global Sources
EE Times-Asia
Stay in touch with EE Times Asia
EE Times-Asia > RF/Microwave

Shanghai Hua Hong purchases Teradyne Integra J750 tester

Posted: 04 Jun 2002 ?? ?Print Version ?Bookmark and Share

Keywords:Integra? Integra J750 test system? RFID? smartcard?

Shanghai Hua Hong Integrated Circuit Co. Ltd has purchased Teradyne Inc.'s Integra J750 test system for contactless smartcard testing.

The Integra J750 with the RFID tests RFID interfaces integrated into VLSI devices like smartcards and ID tags. These devices are commonly found in public transportation, telephone cards, health insurance cards, luggage tags, and a variety of other applications. Integra J750 RFID provides 16 bi-directional RFID channels, including transmitter and receiver path with synchronization and DSP units for device response demodulation. A single RFID board supports parallel tests up to 16 sites.

"The high parallel test capability of the Integra J750 fits our requirements very well," said Mr. Zhang Nan Ping, VP of Shanghai Hua Hong. "Yet the flexibility of the J750 tester means that we can add numerous options and change capability as our testing needs change. As Shanghai Huahong continues to meet the demands of the semiconductor market in China, we look forward to a growing business relationship with Teradyne," says Nan Ping.

Article Comments - Shanghai Hua Hong purchases Teradyne...
*? You can enter [0] more charecters.
*Verify code:


Visit Asia Webinars to learn about the latest in technology and get practical design tips.

Back to Top