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Structural system test via IEEE Std. 1149.1 with hierarchical and multi-drop addressable JTAG Port, SCANPSC110F

Posted: 09 May 2002 ?? ?Print Version ?Bookmark and Share

Keywords:Fairchild?

This application note discusses a structural system test protocol and set of commands for built-in test at both the chip and board level.

View the PDF document for more information.



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