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Credence SoC tester cuts time-to-volume, test costs

Posted: 18 Jul 2002 ?? ?Print Version ?Bookmark and Share

Keywords:credence systems? integrated measurement systems? octet? quartet? soc test platform?

Credence Systems Corp. has introduced the Octet SoC test platform that is designed to decrease time-to-volume and test costs, while delivering high configurability to meet the future test requirements for emerging computer communications and consumer electronics applications SoCs.

The Octet's standard 1,024-pin architecture can be configured with options for 400Mbps, 800Mbps, and 1.6Gbps digital test capabilities, as well as high-speed serial test, and a suite of analog instrumentation to meet SoC test requirements.

The SoC platform also features a fully-integrated software suite for design-to-production test, which includes test development software and virtual test and debug tools from Integrated Measurement Systems Inc.

Octet's Program Developer GUI enables the software modules in the suite to share a single interface for all test program development tasks, thus saving programming time by eliminating unnecessary steps.

The Octet platform also features an advanced, air-cooled design, as well as a multi-site capability, simultaneous multi-rate digital, high-speed serial and a zero-time DSP per pin analog architecture, to improve throughput.

The ATE is compatible with Credence's Quartet series, allowing the use of existing load boards and test programs. Production shipments for the new Octet configurable SoC platform are scheduled for Q4 2002.

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