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Advantest SoC handler simultaneously tests 8 devices

Posted: 16 Dec 2002 ?? ?Print Version ?Bookmark and Share

Keywords:Advantest? m4542ad? dynamic test handler? soc tester? device tester?

Advantest Corp. has announced the release of the M4542AD Dynamic Test Handler, which enables SoC device testing at temperatures ranging from -60C to 150C and delivers a maximum throughput of 6,000 devices/h when performing simultaneous testing of up to eight SoCs.

The machine features the company's newly developed Active Thermal Control (ATC) function, which maintains the preset surface temperature of the device during testing. The ATC function works by using temperature sensors located at the device junctions to constantly monitor the surface temperature of the device.

If the device's surface temperature exceeds the preset limit, a 50W cooling mechanism is activated to bring the temperature back down. Similarly, if the device's surface temperature drops below its preset level, the handler's built-in heater will be activated.

In addition, the M4542AD handler also features a motorized pickup arm that automatically adjusts its stroke and speed to prevent devices from cracking and chipping. This helps reduce the number of damaged devices and thus contributes to lower test costs. To reduce contact failures, the M4542AD uses a pressure control mechanism that enables constant, uniform pressure with the device.

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