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Silicon Metrics, Hitachi to produce SI standard cell libraries

Posted: 12 Feb 2003 ?? ?Print Version ?Bookmark and Share

Keywords:silicon metrics? hitachi? signal integrity? siliconsmart characterization? modeling technology?

Silicon Metrics Corp. has formed a partnership agreement with the Semiconductor & Integrated Circuits unit of Hitachi Ltd, for the development of characterization and modeling tools, as well as methodologies for addressing the issue of signal integrity (SI) in SoC design.

At the foundation of this solution is Silicon Metrics' SiliconSmart characterization and modeling technology. Encouraged by early results, Hitachi has purchased Silicon Metrics' core signal integrity characterization and modeling technology that will be enhanced for distribution to the general semiconductor market later this year.

"Signal integrity issues are a significant problem and major source of risk in the adoption of advanced geometries," said Yoshio Okamura, Department Manager of Design Technology Development Department, Semiconductor & Integrated Circuits at Hitachi. "Silicon Metrics has led the way in defining what has become our gold standard for timing and power models. We want to apply that same advanced technology to the critical signal integrity issues manifesting themselves in process technologies of 0.135m and below," he added.

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