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LeCroy rolls probes for PCI Express, Serial ATA testing

Posted: 04 Mar 2003 ?? ?Print Version ?Bookmark and Share

Keywords:lecroy? wavelink series? adjustable twintip? d600? d200?

LeCroy Corp. has announced the availability of the first three members of a new family of WaveLink series probes to test PCI Express, Serial ATA, and other high bandwidth applications. The probes can be used with the company's WaveMaster and WavePro series of digital storage oscilloscopes, and disk drive and series data analyzers.

The model D600 (7.5GHz bandwidth), D300 (4GHz bandwidth), and D200 (2.5GHz bandwidth) probes all incorporate a SiGe front end and feature Adjustable Twintip technology, which allows the user to set the spacing of the probe tips in a continuously variable fashion.

The adjustable TwinTip allows a maximum distance between the tips of 3mm, while at a minimum the probes can be adjusted until the spacing is zero. The user controls the spacing with a thumbwheel adjustment similar to those which control the focal length of binoculars.

The probes can be used to capture either a single- or differential-ended signal, as long as the probing points are within the three tenths inch spacing limit of the probe tips. They also have a design architecture which gives a divide by 2 attenuation, compared to the divide by 5 or 10 attenuation of other high bandwidth differential probes, resulting to an improved SNR.

The D600 and D300 are targeted for use with low amplitude, high speed signals which are commonly found in today's high speed data communications designs. The D200 is a general purpose probe with a wider voltage range for use with slower speed signals.

LeCroy is an exhibitor at the International IC-China (IIC-China) Design & Exhibition show running from March 3 to 11 at Shanghai, Beijing, and Shenzhen. It is co-located with the Embedded Systems Conference - China and are both organized by eMedia Asia Ltd, a Global Sources and CMP Media joint venture.





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