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Toshiba deploys Keithley IC test system

Posted: 15 Sep 2003 ?? ?Print Version ?Bookmark and Share

Keywords:toshiba? keithley? rf parametric test system? rf ic?

Toshiba Corp. has selected Keithley Instruments Inc.'s S630DC/RF parametric test system to support production of its new generation of semiconductors.

According to Tatsuo Noguchi, senior manager of Toshiba Corp. Semiconductor Co., the S630 system will be instrumental in enabling the company to reduce its cost of test for its next-generation of semiconductors, known as 65nm CMOS devices. Toshiba selected the Keithley technology due to its performance in a series of benchmarking tests.

The model S630DC/RF system is a single-insertion parametric test solution with RF options for probing communications and high-speed digital devices at the wafer level. It allows single device testing up to 20GHz at rates up to ten times faster than typical rack-and-stack systems using separate dc and RF test operations. This system is particularly important for testing semiconductors used in the next-generation of consumer electronics, says Keithley.

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