Global Sources
EE Times-Asia
Stay in touch with EE Times Asia
?
EE Times-Asia > Memory/Storage
?
?
Memory/Storage??

Advantest system tests devices at up to 286MHz

Posted: 09 Dec 2003 ?? ?Print Version ?Bookmark and Share

Keywords:advantest America? Advantest? memory test system? t5377? t5375?

Advantest America Inc., a subsidiary of Advantest Corp., has introduced its latest memory test system that can test up to 256 memory devices simultaneously at 143MHz to 286MHz for double-data-rate (DDR) memories. The T5377 memory test system is flexible enough to perform both front-end multi-purpose memory test and back-end flash-memory test.

The product employs a new system architecture to improve failure identification, allowing it to achieve simultaneous testing of up to 256 memories. With a memory-failure recording capacity of 131GB, the device enables customers to deal promptly with failures of high-capacity, high-speed memory devices, such as 2GB DRAM and 4GB NAND-style flash memories.

The T5377 is the successor to the company?s previous T5375 DRAM test system. The two systems are fully compatible in all aspects, including test programming and probe cards, requiring minimum cost and processing to transfer data when introducing the T5377 into the manufacturing environment.





Article Comments - Advantest system tests devices at up...
Comments:??
*? You can enter [0] more charecters.
*Verify code:
?
?
Webinars

Seminars

Visit Asia Webinars to learn about the latest in technology and get practical design tips.

?
?
Back to Top