Global Sources
EE Times-Asia
Stay in touch with EE Times Asia
EE Times-Asia > Embedded

UMC uses Mentor Graphics FastScan ATPG tool

Posted: 31 Aug 2004 ?? ?Print Version ?Bookmark and Share

Keywords:fastscan? mentor graphics? umc? 130nm? 90nm?

The FastScan, an automatic test pattern generation tool, from Mentor Graphics Corp. has been selected for UMC's 130- and 90nm digital reference flow. FastScan was chosen by UMC for its ability to achieve high test coverage and because it can be easily integrated into any standard design flow.

The UMC digital reference flow provides a top-down proven solution from RTL to GDSII. The comprehensive flow targets customers designing SoCs on UMC's 130- and 90nm processes. The flow is also designed to adapt to any customer design environment. Mentor's work on the ATPG portion of the flow included DFT library translation and verification.

"With FastScan in use at the top IC manufacturers, it's imperative that it offers the highest performance, highest test coverage and scalability to meet changing quality and technology needs," said Robert Hum, VP, general manager, Design Verification and Test division, Mentor Graphics.

Article Comments - UMC uses Mentor Graphics FastScan AT...
*? You can enter [0] more charecters.
*Verify code:


Visit Asia Webinars to learn about the latest in technology and get practical design tips.

Back to Top