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KLA-Tencor, SIINT to bring surface metrology solution

Posted: 03 Sep 2004 ?? ?Print Version ?Bookmark and Share

Keywords:kla-tencor? sii nanotechnology? seiko instruments? profilometer? nanopics 2100?

KLA-Tencor Corp. and SII NanoTechnology (SIINT), a subsidiary of Seiko Instruments, have formed a partnership to distribute SIINT's Nanopics 2100 high-speed, high-resolution atomic force profilometer to markets outside of Japan. Under the terms of the agreement, KLA-Tencor will sell the Nanopics 2100 as a joint product in North America and Europe with the full backing of its system characterization and applications supportenabling broader access to this innovative surface metrology solution.

The Nanopics 2100 is a compact tabletop system that combines the high resolution of an atomic force microscope (AFM) with the ease of use and speed of a surface profiler to enable non-destructive, absolute measurements of surface roughness, step height and surface contour. It is used to help ensure product quality for applications in a wide variety of industries, including data storage, semiconductor and MEMS, as well as polymer science, optics, biotechnology and general industrial research.

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