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Synopsys Galaxy 2004 supports Nvidia latest designs

Posted: 29 Oct 2004 ?? ?Print Version ?Bookmark and Share

Keywords:synopsys? nvidia? galaxy 2004? dft? test automation?

Synopsys Inc. disclosed that Nvidia Corp. has adopted its Galaxy 2004 physically aware test solution for its latest generation designs. Galaxy test is a complete test automation solution for RTL-to- manufacturing test. It eliminates costly iterations between design synthesis and test implementation and enables IC designers to achieve timing, area, power and DFT closure.

On large deep sub-micron (DSM) devices where increasingly more silicon area is consumed by wires rather than transistors there are relatively more manufacturing defects arising from bridging (wire-related) faults than from stuck-at (transistor-oriented) faults. Synopsys' Galaxy 2004 test solution allows Nvidia to use layout extraction information to generate bridging fault tests with TetraMAX DSMTest.

"We worked closely with Synopsys to improve modeling of DSM defects when we realized this would become a key test requirement for our upcoming graphics processor designs," said Dan Smith, director of hardware engineering at NVIDIA. "Synopsys now provides us with complete automatic test pattern generation support for bridging faults. Using TetraMAX DSMTest enables us to test for transition, bridging and path-delay faults, and thereby improve the quality we deliver to our customers."





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