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A standardized procedure for the direct measurement of sub-picosecond RMS jitter in high-speed analog-to-digital converters.

Posted: 01 Dec 2004 ?? ?Print Version ?Bookmark and Share

Keywords:texas instruments? analog-to-digital converters? adcs?

This app note proposes an innovative, reliable characterization technique that allows to measure ultra-low jitter levels while also discriminating noise contributions due to jitter from other phenomena (voltage reference and substrate noise, high-amplitude distortion) in ADCs.

View the PDF document for more information.

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