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ADI rolls out toolkit for NI LabVIEW

Posted: 07 Feb 2005 ?? ?Print Version ?Bookmark and Share

Keywords:analog devices? adi? blackfin test integration toolkit? labview? graphical development environment?

With Analog Devices Inc.'s (ADI's) new Blackfin Test Integration Toolkit for LabVIEW, engineers can now use National Instruments' (NI's) LabVIEW graphical development environment with ADI's visualdsp++++ embedded development environment to streamline the development of Blackfin-based systems, the two companies announced.

The new toolkit, which is included free with ADI's VisualDSP++ software and hardware evaluation kits, integrates with LabVIEW to provide design engineers with a single development, prototyping and test environment for applications running on the Blackfin microprocessor.

Gerald McGuire, ADI GM for Media Platforms and Services, DSP and Systems Products Division, said, "With the new Analog Devices Blackfin Test Integration Toolkit for LabVIEW, design engineers can graphically view data to verify algorithm performance earlier in the design process and compare data with real-world signals using NI measurement hardware."

Using the Blackfin Test Integration Toolkit for LabVIEW, design engineers now have an integrated tool chain for easily building automated test systems and utilities for their Blackfin-based systems, said the press release. With easier test integration, they can iteratively verify their designs throughout the design cycle and identify flaws early in the process, added NI and ADI.

The new toolkit also gives engineers an intuitive and familiar graphical tool to build test and verification systems. Engineers can use the toolkit to develop Blackfin test systems by automating routine VisualDSP++ processes, such as building, downloading and running code, with a simple set of LabVIEW virtual instruments.




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