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UMC uses Mentor embedded compression solution for production test

Posted: 29 Mar 2005 ?? ?Print Version ?Bookmark and Share

Keywords:embedded deterministic test? testkompress?

United Microelectronics Corp. (UMC) has adopted Mentor Graphics Corp.'s TestKompress embedded deterministic test (EDT) tool for use in 90- and 130nm reference flows.

The TestKompress tool is claimed to reduce manufacturing test time by up to 100x compared with other test alternatives, helping users increase test coverage and test quality on their complex devices without compromising test time or test cost.

Throughout trials at UMC, the TestKompress tool has demonstrated an ability to reduce test time and data size by 80x and achieve 99 percent test coverage. "TestKompress has shown that it can deliver outstanding test performance for complex devices while maintaining reasonable cost," said Ken Liou, director of the IP development and design support division at UMC.

Mentor says the tool fits into any scan-based design flow, and features x-state tolerance that eliminates the need to add logic or adhere to strict design requirements imposed by the test structures. Additionally, the TestKompress tool includes at-speed test capabilities to improve detection of speed-related defects at smaller process technologies.





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