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Advantest rolls new test solutions

Posted: 20 Jun 2005 ?? ?Print Version ?Bookmark and Share

Keywords:Advantest? semiconductor test equipment? memory tester? t5588? dynamic test handler?

Advantest Corp., a supplier of semiconductor test equipment, unveiled its latest memory tester, the T5588, and new dynamic test handler, the M6300. With twice the parallel test capacity of currently available models, the new test solution is ideal for high-volume production of high-speed, double-data- rate DRAM (ddr2-sdram) devices, said the press release.

The T5588 memory test system offers a maximum test speed of 800Mbps in its DDR mode. In its two-station configuration, it boasts a 512-device parallel package test capacity, which is twice the capacity of its predecessorthe T5593, contributing to space-efficient test design.

Meanwhile, the high-performance M6300 material handler is capable of parallel processing up to 256 memory devices with a range of packaging formats, including TSOP-1, TSOP-2, CSP and BGA. Combining increased functionality with the processing speed of the prior-generation M6542AD handler, the M6300 delivers a throughput of up to 12,000 units-per-hour (UPH). Its thermal-control function supports tests within a temperature range of -30C to 125C, with an option to extend the lower range to -55C. In addition, Advantest has developed a new air-pressure control system that adjusts contact pressure and speed to minimize contact failures, while enabling increased accuracy during pick-up and transportation of these small, light devices.

According to the company, this new construction has allowed them to reduce the number of parts in each change kit by approximately 70 percent, contributing to significant savings for customers in both labor and the number of parts that must be purchased at changeover. These new products will double today's parallelism capability and significantly lower the cost-per-site for performance volume testing of DDR2-SDRAMs, added Advantest.




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