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Mentor Graphics scan test tool in TSMC's Reference Flow 6.0

Posted: 30 Jun 2005 ?? ?Print Version ?Bookmark and Share

Keywords:mentor graphics? taiwan semiconductor? tsmc? testkompress? scan test tool?

Mentor Graphics Corp. announced that Taiwan Semiconductor Mfg Co. (TSMC) has added the TestKompress scan test tool to its reference flow 6.0. According to the press release, the TestKompress provides an effective means of increasing volume manufacturing test quality and reducing test cost for nanometer designs. Reference Flow 6.0 also includes Mentor Graphics DFT tool suite-Fastscan, MBISTArchitect and BSDArchitect.

The Mentor Graphics TestKompress embedded deterministic test (EDTTM) tool reduces both manufacturing test time and test data volume by up to 100X, helping users increase test coverage and test quality on their complex devices. This compression enables manufacturers to run a large battery of tests without slowing test time, thereby maintaining a low cost of test. The tool also features robust x-state tolerance that eliminates the need to either add functional logic or adhere to strict design requirements imposed by the test structures. In addition, the TestKompress tool fits well into any scan-based methodology, and features a usage methodology that is intuitive to engineers familiar with traditional ATPG.

Both the TestKompress and FastScan feature advanced at-speed test capabilities to improve detection of speed-related defects found at smaller process technologies. TSMC has also added the MBISTArchitect and BSDArchitect tools from Mentor Graphics to provide a complete design for test (DFT) tool set in Reference Flow 6.0. MBISTArchitect provides at-speed test of embedded memories operating up to 1GHz; BSDArchitect is used to insert IEEE 1149.1 boundary scan that enables in-circuit test.

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