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Semi industry roadmap subject of Semicon West keynote

Posted: 15 Jul 2005 ?? ?Print Version ?Bookmark and Share

Keywords:semiconductor? cmos scaling?

An aggressive future roadmap for semiconductor technology development will unveiled by Texas Instruments executive Bob Doering during a keynote speech at Semicon West in San Francisco today.

Doering, who is also the Semiconductor Industry Association (SIA) representative to the International Technology Roadmap for Semiconductors (ITRS) Roadmap Committee, will discuss updated ITRS targets and the challenges facing semiconductor makers as they encounter potential roadblocks in CMOS scaling.

"The 2005 ITRS roadmap proposal is significantly more aggressive than previous versions on several key scaling parameters," Doering said in an earlier statement. "However, the ITRS is also entering a new era as the industry begins to address the theoretical limits of CMOS scaling. The 2005 ITRS highlights the challenges along the 15-year outlook and starts to examine what might come next."

Doering serves, along with Paolo Gargini of Intel, as one of the two U.S. representatives to the ITRS International Roadmap Committee, and is a Senior Fellow and silicon technology development strategy manager at TI.

Doering will overview how and when key roadmap parameters are targeted to evolve as the industry works to overcome the identified barriers. While over the past decade the pace of feature scaling has been accelerated, the 2005 ITRS proposes a transition period between now and 2010, after which essentially all critical dimensions return to the historical average rate of .7X scaling every three years.

"The primary objective of the ITRS roadmap is to identify the key technology challenges out to a 15-year horizon and place them in the spotlight for industry consideration," emphasized Doering. "Our hope is that the focused attention will influence greater collaboration and new research initiatives to apply resources that ultimately deliver innovative, cost- effective solutions."

- EE Times





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