Stay in touch with EE Times Asia

EE Times-Asia > T&M

T&M??

DFT, DFM tests assure quality SoC design

Posted: 16 Aug 2005 ?? ?

Print Version ?

Keywords:dft? dfm? soc? hdc? dram?

Learn the importance of design-for-manufacturability and design-for-test in ramping up advanced products in deep-submicron technologies

View the PDF document for more information.

Editor's Choice

votes: ?

Add to Favorites

Standard metal enables paradigm shif...

Testing and qualifying a Bluetooth d...

Article Comments - DFT, DFM tests assure quality SoC de...

Username: Visitor(To avoid code verification, simply login or register with us. It is fast and free!)

Comments:??	*? You can enter [0] more charecters.
*Verify code:

Site resource about DFT.HTM?from=ART_Search

Related Info

What is design for manufacturability (DFM)?
The design methodology called "design for manufacturability" (DFM) includes a set of techniques used to modify the design of semiconductors in order to make them more manufacturable by improving their functional yield, parametric yield, reliability etc.

DFT, DFM tests assure quality SoC design

Read the latest news, trends and analysis

By Type

By Department

By Technology

Learn design techniques

Share your viewpoint

Get support

Stay in touch with us

Partner with us