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TI makes ADC data capturing faster

Posted: 02 Sep 2005 ?? ?Print Version ?Bookmark and Share

Keywords:tsw1100? texas instruments? ti? analog-to-digital converter? adc?

Texas Instruments Inc. (TI) has introduced a new tool that promises to save design time and development cost in high-speed applications, allowing for fast digital data capture from TI's high-speed, high-resolution ADCs.

The new data capture card and software allow the user to easily evaluate ADC performance and quickly select the best device for their application in systems such as 2.5G/3G wireless base stations, communications and test and measurement equipment.

The TSW1100 features data capture speeds of up to 170MS/s, resolution of up to 16 bits and data capture depths of up to 1 million points. It can operate in single-channel or dual-channel mode, allowing synchronous capture of a dual-channel ADC. Data is transferred via USB interface, allowing easy control from a personal computer, and it requires only one wall-mounted power supply for operation.

In the past, analyzing ADC performance often required investing in a costly logic analyzer and performing complex analysis routines, said TI. For select high performance TI ADCs, the TSW1100 makes those steps unnecessary, providing accurate data with its embedded logic analyzer mode. With the accompanying software, users quickly compute ADC performance metrics such as SNR and SFDR. The software also allows the user to save the raw data set or performance graphs for future analysis.

Priced at $499, the TSW1100 includes the data capture board, software, power supply and USB cable.




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