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Inovys debuts analysis tool for ATE

Posted: 02 Sep 2005 ?? ?Print Version ?Bookmark and Share

Keywords:inovys? automatic test equipment? ate? software analysis tool? flopplot waferview?

Inovys Corp., a supplier of automatic test equipment (ATE), has rolled out a software analysis tool said to boost chip yields and cycle times.

The tool, dubbed the FlopPlot WaferView, is used with the company's Ocelot ZFP line of ATE. By measuring and mapping performance levels of all devices on the wafer in semiconductor test, WaferView helps identify and resolve design or process marginalities, according to Inovys.

WaferView enables the collection of performance data across multiple wafers in IC test. Performance issues can be sorted by physical location on the wafer, electrical design element or number of occurrences. This enhances statistical process control capabilities in production to provide early warning of process excursions, the company claimed.

"As semiconductor devices move to advanced technology nodes of 90nm, 65nm and below, the challenges in identifying and diagnosing faults increases significantly with a dramatic impact on time to volume production," said Colin Ritchie, vice president of marketing at Inovys, in a statement.

"By leveraging DFT methodologies, Inovys helps our customers meet those challenges," he said. "WaferView enables customers to achieve faster yield ramps for new devices by quickly isolating process problems to a location on the wafer, individual die on the wafer, or even sub-circuit elements on the individual die. Once in volume production, WaferView further extends our customers ability to monitor that the process remains in control."

EE Times

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