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Renesas to use Ponte Solution yield analysis

Posted: 24 Oct 2005 ?? ?Print Version ?Bookmark and Share

Keywords:renesas? ponte? design-for-yield? yield analysis? 65nm?

Design-for-yield company, Ponte Solutions, Inc. has announced that Renesas Technology Corp. of Japan will use its model-based yield analysis technology. Renesas will use the technology for critical area analysis and yield-loss reduction from random defect-limited yield issues for 65nm technologies. The two companies will also work on more advanced yield analysis technologies.

"We have investigated the capabilities of Ponte's model-based yield analysis technology," said Dr. Nakaya, executive general manager at Renesas. "We anticipate Ponte's potential to deliver a comprehensive solution for our yield analysis and enabling enhancement for defect-limited yield issues."

"Renesas has advanced nanometer technologies and we are very excited that Ponte's model-based yield analysis technology was chosen by Renesas in 90nm and 65nm design nodes for pro-active analysis of silicon yield sensitivity, enabling yield enhancement at the design stage," said Alex Alexanian, Ponte's president and CEO.

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