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EDA/IP??

EDA partnership yields DFM sign-off tool

Posted: 24 Jan 2006 ?? ?Print Version ?Bookmark and Share

Keywords:Acuma? EYES? chip yield? Nannor Technologies? Predictions Software?

Nannor Technologies Inc. and Predictions Software announced the integration of the Acuma chip level layout optimization tool and the EYES yield analysis software. According to the two companies, this combined yield driven design optimization solution facilitates the application of full chip yield optimization techniques in complete harmony with detailed process manufacturing data.

The demand for yield driven design is fueled by increases in design and process complexities that have resulted in dramatic decreases in yield and manufacturability, said the press release. General yield models for industry standard processes or custom yield models for proprietary processes can now be applied to layout via critical area extraction and analysis. The low yielding areas of the design are then targeted for optimization and the resulting yield improvements are calculated.

"The Acuma and EYES partnership now makes it possible for customers to include process specific DFM sign-off within the mainstream design flow" said Yongbo Jia, president of Nannor. "Studies with customer designs have shown a 30 percent or more reduction in the faults that can prevent a design from yielding."




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