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Mentor releases new design kits for Intel's IBIS 4.1 AMS models

Posted: 13 Feb 2006 ?? ?Print Version ?Bookmark and Share

Keywords:ICX? Signal Integrity? Design Kit? IBIS 4.1 AMS? Mentor Graphics?

Mentor Graphics Corp. announced the release of the ICX and ICX Pro Signal Integrity design kits for Intel's next generation I/O controller hub. According to the press release, these kits are the first to utilize Intel's new IBIS 4.1 and IEEE 1076.1 standard VHDL-analog/mixed-signal (AMS) models.

The ICX solution combines the electrical and physical aspects of a design, providing an integrated design and verification environment for signal integrity and timing analysis during layout. This environment uses true electrical rules to drive the placement and routing, as well as verification, of high-speed boards, ensuring electrically-correct designs the first time. ICX Pro Explorer provides a schematic-based what-if signal integrity environment, with extensive capabilities for pre-layout simulation, including sweeps.

"Mentor Graphics is pleased to support these new IBIS 4.1 AMS models from Intel," said Henry Potts, VP and GM of Mentor's systems design division. "We are committed to open industry standards, such as IBIS 4.1 and IEEE 1076.1 VHDL-AMS, and believe that they provide the flexibility and standardization required to cover modeling requirements now and into the future."

The ICX and ICX Pro kits for Intel's next generation I/O controller hub also includes a complete IBIS model for the I/O controller hub, including AMS models for the PCI Express, Serial ATA and USB2 interfaces, as well as IBIS-formatted S-parameter models for the package pins and connectors, and traditional IBIS models for the other lower-speed interfaces.

The ICX kit also includes a custom menu for configuring device and test conditions, and a complete reference design layout for Intel's next generation chipset imported into the tool ready for SI analysis, Mentor said. The next generation I/O controller hub high-speed receiver models also include a novel application of AMS which measures and plots eye-opening values in real-time while the simulation is in progress.




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