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AMD to migrate 65nm testing to Credence ATE platform

Posted: 13 Feb 2006 ?? ?Print Version ?Bookmark and Share

Keywords:Credence Systems? Advanced Micro Devices? AMD? Sapphire ATE?

Credence Systems Corp., a provider of test solutions from design to production for the semiconductor industry, announced that Advanced Micro Devices Inc. (AMD) has chosen Credence's Sapphire ATE platform as its test system of record.

According to the press release, AMD will use the Sapphire platform for all of its advanced processors testing requirements, from development and characterization through high-volume production test. Early collaboration efforts with AMD resulted in an AMD Opteron processor-based workstation controller option for the Sapphire platform, achieving up to 40 percent improvement in test efficiency, said the two companies.

"AMD has chosen to migrate all of our next-generation, 65nm testing requirementsfrom debug through high volume production testto the Sapphire system," said Daryl Ostrander, SVP of AMD's logic technology and manufacturing. "It is an extremely robust, flexible and scalable system that delivers the performance that we need for a very low cost."

The Sapphire ATE system promises considerable configuration flexibility with test capabilities optimized from DC to multi-gigahertzdigital and analog, structural and functionalwith fully encapsulated instruments that can be inserted into any slot in the test head. Designed for simplicity and cost-effectiveness, the Sapphire is a highly integrated, small footprint system with reduced power requirements. Its high-bandwidth bus provides advanced communications and precise synchronization between instruments, enhancing performance in any configuration.

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