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Tool assists in PCB testing and in-system programming

Posted: 05 Apr 2006 ?? ?Print Version ?Bookmark and Share

Keywords:JTAG ProVision? PCB testing? in-system programming? JTAG Technologies?

JTAG Technologies announced the introduction of JTAG ProVision, a tool that aims to accelerate and simplify the development of boundary-scan applications based on the IEEE 1149.x standards. According to JTAG, the tool assists engineers in reaching their test coverage and in-system programming objectives in less time.

The ProVision's application wizard leads users through the sequence of steps to prepare test and in-system programming applications. Graphical tools are said to simplify the management of design data while JTAG Technologies' design-for-test (DFT) analysis software monitors coverage.

The tool creates a set of tests and in-system programming solutions, analyzing the boundary-scan and non-boundary-scan portions of a design. JTAG Technologies' approach to device modeling is said to provide the information needed to properly control non-scan clusters for test coverage, with manual override capability for skilled users. The tool can handle all levels of target complexity from single boards with one, or multiple, test access ports through complex, multi-board configurations.

"With the growing demand for complex circuit board test and in-system programming, electronics developers and manufacturers are seeking ways to further accelerate application development without compromising the quality of their test coverage and in-system programming results," said Ray Dellecker, U.S. marketing manager of JTAG Technologies. "JTAG ProVision includes an intuitive guide, allowing users to prepare and validate their boundary-scan applications while maintaining coverage and quality."

JTAG ProVision will be available for shipment in mid-April. Boundary-scan applications developed with JTAG ProVision are fully compatible with JTAG Technologies' offering of production tools including its stand-alone boundary-scan systems and the offering of ICT, flying probe and functional test integrations.

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