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Tektronix to showcase new products at NAB conference

Posted: 17 Apr 2006 ?? ?Print Version ?Bookmark and Share

Keywords:Tektronix? RTX130A? MPEG? National Association of Broadcasters? NAB?

Tektronix Inc. announced that it will feature an extensive range of new and enhanced products at next week's National Association of Broadcasters (NAB) 2006 Conference.

The company will showcase its new RTX130A integrated MPEG and RF signal generator, which offers both unmodulated and RF modulated playout of MPEG transport streams, supporting both cable (QAM A, B & C) and terrestrial (ATSC) standards. Designed to act as a compact, portable test source for product development and manufacturing test, this product addresses the need for a high performance repeatable test streams source at the RF, IF and unmodulated transport stream interfaces, enabling faster and higher quality product development.

The new family of multi-format waveform monitors that enable customers to achieve the quality levels they require for video production, distribution and broadcasting will also be on display at NAB. According to the press release, the WFM6100, WFM7000 and WFM7100 waveform monitors offer industry-leading performance, reliability and flexibility to help video professionals produce and deliver high quality video and audio content for mixed-format systems in the emerging digital era. These new products offer customers one of the widest range of product configurations and upgrades, and industry-first capabilities that enable the seamless migration from composite video configurations to complete HD/SD/composite solutions.

Tektronix will also demonstrate new capabilities of its WVR7100 and WVR6100 Rasterizers, including Eye pattern display, jitter measurements and cable length measurement for high definition-serial digital interface and standard definition-serial digital interface signals. The company added that the new monitoring capabilities in the WVR7100 and WVR6100 indicate system degradations to engineers before they become quality problems, reducing time and effort in fault detection, problem diagnosis and failure recovery.




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